DIST-based detection and diagnosis of multiple faults in FPGAs

Author

Abramovici, Miron ; Stroud, Charles

Author_Institution

Lucent Technol. Bell Labs., Murray Hill, NJ, USA

fYear

2000

fDate

2000

Firstpage

785

Lastpage

794

Abstract

We present a BIST-based approach able to detect and accurately diagnose any single and most multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs). For any faulty PLB, we also identify its internal faulty modules or modes of operation. This accurate diagnosis provides the basis for both failure analysis used for yield improvement and for any repair strategy used for fault-tolerance. We present experimental results showing detection and identification of faulty PLBs in actual defective FPGAs

Keywords

automatic test pattern generation; built-in self test; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; ATPG; BIST-based detection; FPGA; failure analysis; fault diagnosis; fault-tolerance; internal faulty modules; modes of operation; multiple faulty programmable logic blocks; repair strategy; single faulty programmable logic blocks; yield improvement; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Programmable logic arrays; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2000. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-6546-1

Type

conf

DOI

10.1109/TEST.2000.894275

Filename

894275