• DocumentCode
    2763401
  • Title

    A new technique for measuring the inductance of pin grid array packages

  • Author

    Mosley, Larry E. ; Mallik, Debendra ; Bhattacharyya, Bidyut K.

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    280
  • Lastpage
    285
  • Abstract
    A technique for measuring the inductance of pin-grid-array packages is described. It includes the design of a board that allows the measurements of inductance to values less than 10 pH. The board is unique in that it allows measurement of the inductance and resistance of 132-lead packages in less than an hour. The board was designed to allow testing of the package inductance with current sourced through multiple power pins and sunk through multiple ground pins. This measurement technique gives a true measure of the inductance with respect to the package ground loop, making possible the determination of the variation of the power and ground loop inductance from package to package. The authors discuss the design of the test board and how the board was modeled to remove the inductance, capacitance, and resistance of the board itself. The method is compared with the conventional technique for measuring inductance, and sample data for both methods are presented and compared. Results obtained by measuring the resonant frequency of the test boards show that the new method is more accurate than the old one
  • Keywords
    inductance measurement; packaging; 132-lead packages; ground loop inductance; inductance; multiple power pins; package ground loop; pin grid array packages; resonant frequency; test board; Capacitance; Electrical resistance measurement; Electronics packaging; Frequency measurement; Inductance measurement; Measurement techniques; Pins; Power measurement; Resonant frequency; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76157
  • Filename
    76157