• DocumentCode
    2763708
  • Title

    HD2BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs

  • Author

    Benso, Alfredo ; Chiusano, Silvia ; Carlo, Stefano Di ; Prinetto, Paolo ; Ricciato, Fabio ; Spadari, Maurizio ; Zorian, Yervant

  • Author_Institution
    Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    892
  • Lastpage
    901
  • Abstract
    Proposes HD2BIST, a complete hierarchical framework for BIST scheduling, data patterns delivering, and diagnosis of a complex system including embedded cores with different test requirements as full scan cores, partial scan cores, or BIST-ready cores. The main goal of HD 2BIST is to maximize and simplify the reuse of the built-in test architectures, giving the chip designer the highest flexibility in planning the overall SoC test strategy. HD2BIST defines a test access method able to provide a direct “virtual” access to each core of the system, and can be conceptually considered as a powerful complement to the P1500 standard, whose main target is to make the test interface of each core independent from the vendor
  • Keywords
    built-in self test; circuit layout CAD; integrated circuit testing; logic testing; scheduling; BIST scheduling; BIST-ready cores; HD2BIST; P1500 standard; SoC test strategy; built-in test architectures; data patterns delivery; embedded cores; full scan cores; hierarchical framework; partial scan cores; test access method; test interface; Automatic logic units; Built-in self-test; Circuit testing; Costs; Electronic equipment testing; Energy consumption; Hardware; Large scale integration; Logic testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894300
  • Filename
    894300