• DocumentCode
    2763960
  • Title

    Device interfacing: the weakest link in the chain to break into the giga bit domain?

  • Author

    Schoettmer, Ulrich ; Wagner, Chris ; Bleakley, Tom

  • fYear
    2000
  • fDate
    2000
  • Firstpage
    995
  • Lastpage
    1004
  • Abstract
    With approaching 1 Gb/s digital I/O buses and I/O margins in the range of 250 ps and less, the signal delivery path becomes increasingly more challenging to manage. Second order effects, systematic errors, and ATE to device interactions, which used to be “noise level ” at 100 Mb/s rates, become more and more significant when attempting to make accurate measurements in the Gb/s domain. This paper provides an overview of the challenges, the magnitudes, the associated approaches, and practical methods to address them
  • Keywords
    automatic test equipment; calibration; measurement errors; peripheral interfaces; timing jitter; ATE accuracy; ATE to device interactions; Gigabit digital I/O buses; calibration; delay error; device interfacing; driver model; error sources; eye diagrams; jitter error; level induced offsets; pin to pin dispersion; second order effects; signal delivery path; systematic errors; timing offsets; Bandwidth; Calibration; Guidelines; Hardware; Paper technology; Radio frequency; System testing; Technology management; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894312
  • Filename
    894312