Challenges of high supply currents during VLSI test

Author

Johnson, Gerald H.

Author_Institution

Teradyne Inc., Fridley, MN, USA

fYear

2000

fDate

2000

Firstpage

1013

Lastpage

1020

Abstract

Very high power supply currents required during test of advanced VLSI parts pose problems for both the ATE power supply and the interconnect to the DUT. Power supply design, inductance, resistance, filter capacitance and sense points all become critical. Design of the DUT interface board requires careful attention to detail

Keywords

VLSI; automatic test equipment; capacitance; inductance; integrated circuit testing; power supplies to apparatus; ATE power supply; DUT interconnect; DUT interface board design; VLSI test; advanced VLSI parts; current capability; filter capacitance; interconnect inductance; interconnect resistance; response time; sense points; very high power supply currents; voltage drop; Bandwidth; Capacitance; Current supplies; Delay; Inductance; Power supplies; Rivers; Testing; Very large scale integration; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2000. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-6546-1

Type

conf

DOI

10.1109/TEST.2000.894314

Filename

894314

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2763995