Title :
Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis
Author :
Huang, Jiun-Lang ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
Delta-sigma modulation has become popular in modern analog-to-digital modulator design due to its relatively high immunity from process variations. We propose efficient characterization techniques to obtain the key performance parameters of the 1-bit first-order delta-sigma modulator which is intended to be used as an on-chip analog signal digitizer for BIST applications. Numerical simulations have been performed to validate the techniques and the results indicate that accurate estimation of the parameters can be obtained at the presence of noise
Keywords :
automatic testing; built-in self test; delta-sigma modulation; BIST applications; DC offset; modulator testing; noisy ramps; numerical simulations; on-chip analog signal analysis; on-chip analog signal digitizer; one-bit first-order delta-sigma modulator; oversampling modulation; performance parameters; transfer curve; Automatic testing; Built-in self-test; Circuit testing; Delta modulation; Digital modulation; Digital signal processing; Numerical simulation; Signal analysis; Signal generators; System testing;
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-6546-1
DOI :
10.1109/TEST.2000.894315
