Digital signature proposal for mixed-signal circuits

Author

Brosa, Anna Maria ; Figueras, Joan

Author_Institution

Dept. of Electron., Univ. Politecnica de Catalunya, Barcelona, Spain

fYear

2000

fDate

2000

Firstpage

1041

Lastpage

1050

Abstract

A new BIST structure, based on the information provided by the XY-operation (Lissajous curves) is introduced in this paper. A digital signature is obtained which is used to discriminate catastrophic as well as parametric defects. High fault coverage is achieved when applying the proposed BIST on an ITC´97 benchmark circuit where 92% of the catastrophic defects and 87.5% of the parametric defects analyzed produced digital signatures clearly distinguishable from the golden signature

Keywords

built-in self test; continuous time filters; integrated circuit testing; mixed analogue-digital integrated circuits; waveform analysis; waveform generators; BIST structure; Lissajous curves; XY-operation; benchmark circuit; catastrophic defect; continuous-time filter; control lines; digital signature proposal; high fault coverage; mixed-signal circuits; parametric defects; zero-crossing detector; zone signal; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital signatures; Distortion measurement; Integrated circuit testing; Proposals; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2000. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-6546-1

Type

conf

DOI

10.1109/TEST.2000.894317

Filename

894317