DocumentCode :
2764113
Title :
An analysis of the delay defect detection capability of the ECR test method
Author :
Kim, Seonlu ; Chakravarty, Sreejit ; Vinnakota, Bapiraju
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear :
2000
fDate :
2000
Firstpage :
1060
Lastpage :
1069
Abstract :
An analysis of the energy consumption ratio (ECR) test method, based on simulation study of resistive bridges and resistive opens, is presented. These defect classes comprise a very significant percentage of the defects causing speed failures. We show: (i) bridges causing delay failures and detectable by the difference IDDQ method is detected by the ECR test method; and (ii) bridges and opens causing delay failures but not detectable by the difference IDDQ method are also detected by the ECR test method. This highlights a very significant advantage of the ECR test method over IDDQ test methods. The underlying reason as to why the ECR test method is good at detecting delay defects is presented. Based on that we develop a new test method called the ECR-VDD test. The usefulness of the new method in detecting delay defects is validated using simulation results
Keywords :
delays; integrated circuit testing; ECR-VDD test; delay defect detection; difference IDDQ testing; energy consumption ratio test method; failure mechanism; numerical simulation; resistive bridge; resistive open; Analytical models; Automatic test equipment; Bridge circuits; Circuit testing; Computational modeling; Costs; Delay; Energy consumption; Leakage current; Plugs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2000. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-6546-1
Type :
conf
DOI :
10.1109/TEST.2000.894319
Filename :
894319
Link To Document :
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