• DocumentCode
    2764558
  • Title

    Room Temperature Steady-State and Transient Carrier Transport Properties of Germanium Single Electron/Hole Transistors

  • Author

    Lai, W.T. ; Li, Peter W. ; Kuo, D.M.T.

  • Author_Institution
    Dept. of Electr. Eng., National Central Univ., ChungLi
  • fYear
    2006
  • fDate
    15-17 May 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A single electron transistor (SET) is an ultimate scheme of electronic devices for the purpose of controlling current with one charge precision based on Coulomb blockade effect. A SET could be used as a highly sensitive electrometer and might provide great potential applications for quantum information technology. For RT operation, the size of a Si-based QD should be less than 10 nm to prevent errors caused by thermal fluctuation. Nevertheless, control of nanometer-scaled thickness, area, and volume is not easy even when state of the art lithography and/or self-organization techniques are used. The solution we propose to alleviate this problem is to form Ge QDs by selective oxidation of Si1-xGexSi-on-insulator (SOI) (Li et al., 2004). Using this method, Ge QDs are comparatively uniform and thermodynamically stable since Ge QDs are confined by the insulating layers. The proposed process is compatible to CMOS technology and can be easily adapted in the fabrication of embedded circuits
  • Keywords
    CMOS integrated circuits; Ge-Si alloys; carrier mobility; germanium; oxidation; semiconductor quantum dots; single electron transistors; CMOS technology; Coulomb blockade effect; Ge QD; Si-on-insulator; SiGe; carrier transport property; embedded circuits; single electron hole transistor; CMOS technology; Charge carrier processes; Computer errors; Fluctuations; Germanium; Information technology; Single electron transistors; Steady-state; Temperature sensors; Thickness control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    1-4244-0461-4
  • Type

    conf

  • DOI
    10.1109/ISTDM.2006.246510
  • Filename
    1716004