DocumentCode :
2765017
Title :
Reducing Threading Dislocation Densities in SiGe Mismatched Layers by Controllingc Strainc rate and Surface Roughness
Author :
Gupta, Swastik ; Yu Bai ; Isaacson, D.M. ; Fitzgerald, E.A.
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA
fYear :
2006
fDate :
15-17 May 2006
Firstpage :
1
Lastpage :
2
Abstract :
Further insight into strained layer relaxation processes have been achieved in this work. Effects of surface roughness, dislocation velocities, and dislocation nucleation have been de-coupled. In order to achieve low threading dislocation density with a high degree of relaxation, we are forced to create structures that introduce a high degree of lattice mismatch at the surface, i.e. a gradient in Ge composition in thickness. Thus, the graded layer must be introduced. However, these experiments have shed further light on the design of such structures, and we have produced relaxed layers with low threading dislocation density that are 4times less thick than their control graded composition layers
Keywords :
Ge-Si alloys; dislocation density; elemental semiconductors; nucleation; relaxation; surface roughness; SiGe; SiGe mismatched layers; dislocation nucleation; dislocation velocities; graded composition layers; lattice mismatch; strain rate; strained layer relaxation process; surface roughness; threading dislocation densities; Capacitive sensors; Germanium silicon alloys; Lattices; Rough surfaces; Silicon alloys; Silicon germanium; Strain control; Surface roughness; Temperature; Weight control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International
Conference_Location :
Princeton, NJ
Print_ISBN :
1-4244-0461-4
Type :
conf
DOI :
10.1109/ISTDM.2006.246535
Filename :
1716029
Link To Document :
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