• DocumentCode
    2765035
  • Title

    Comparison of different interconnect technologies for high frequency applications

  • Author

    Roose, Nic De ; Ryckebusch, Marc ; Botte, Marnix ; Beyne, Eric

  • Author_Institution
    Bell Alcatel, Brussels, Belgium
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    319
  • Lastpage
    324
  • Abstract
    The technological capabilities of the existing interconnection technologies used at Bell-Alcatel are being analyzed with respect to the impact of the increasing bit rates for digital switching systems. A program was set up with IMEC (Interuniversity Microelectronic Center) to measure both the electrical performance and process capabilities of thick-film-interconnect, printed boards, and multiwire technology. The testing was done with bit rates up to 600 Mb/s. The work consisted of the following: simulation of the transmission behavior for different technologies; evaluation and determination of test vehicles for different technologies; actual manufacture of a number of interconnect test vehicles in different technologies, under controlled conditions; and measurement and comparison of the results with simulation up to a frequency of at least 10 GHz. Results are presented, and some conclusions are drawn. In particular, it is found that multiwire has intrinsically good features for high-speed interconnect and that multilayer technology is the compromise with the most stable characteristics
  • Keywords
    hybrid integrated circuits; printed circuits; thick film circuits; 10 GHz; 600 Mbit/s; Bell-Alcatel; IMEC; Interuniversity Microelectronic Center; bit rates for digital switching systems; determination of test vehicles; electrical performance; high frequency applications; high-speed interconnect; interconnect technologies; interconnect test vehicles in different technologies; multilayer PCB; multilayer technology; multiwire technology; printed boards; process capabilities; technological capabilities; thick-film-interconnect; transmission behavior; Bit rate; Electric variables measurement; Frequency measurement; Microelectronics; Nonhomogeneous media; Switching systems; Testing; Thickness measurement; Vehicles; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76166
  • Filename
    76166