DocumentCode
2765035
Title
Comparison of different interconnect technologies for high frequency applications
Author
Roose, Nic De ; Ryckebusch, Marc ; Botte, Marnix ; Beyne, Eric
Author_Institution
Bell Alcatel, Brussels, Belgium
fYear
1989
fDate
26-28 Apr 1989
Firstpage
319
Lastpage
324
Abstract
The technological capabilities of the existing interconnection technologies used at Bell-Alcatel are being analyzed with respect to the impact of the increasing bit rates for digital switching systems. A program was set up with IMEC (Interuniversity Microelectronic Center) to measure both the electrical performance and process capabilities of thick-film-interconnect, printed boards, and multiwire technology. The testing was done with bit rates up to 600 Mb/s. The work consisted of the following: simulation of the transmission behavior for different technologies; evaluation and determination of test vehicles for different technologies; actual manufacture of a number of interconnect test vehicles in different technologies, under controlled conditions; and measurement and comparison of the results with simulation up to a frequency of at least 10 GHz. Results are presented, and some conclusions are drawn. In particular, it is found that multiwire has intrinsically good features for high-speed interconnect and that multilayer technology is the compromise with the most stable characteristics
Keywords
hybrid integrated circuits; printed circuits; thick film circuits; 10 GHz; 600 Mbit/s; Bell-Alcatel; IMEC; Interuniversity Microelectronic Center; bit rates for digital switching systems; determination of test vehicles; electrical performance; high frequency applications; high-speed interconnect; interconnect technologies; interconnect test vehicles in different technologies; multilayer PCB; multilayer technology; multiwire technology; printed boards; process capabilities; technological capabilities; thick-film-interconnect; transmission behavior; Bit rate; Electric variables measurement; Frequency measurement; Microelectronics; Nonhomogeneous media; Switching systems; Testing; Thickness measurement; Vehicles; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
Conference_Location
Nara
Type
conf
DOI
10.1109/IEMTS.1989.76166
Filename
76166
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