• DocumentCode
    2765103
  • Title

    The factors influencing environmental reliability of chip-on glass technology

  • Author

    Murakoshi, Kouichi ; Kanazawa, Jyunichi ; Ogata, Shigeyuki

  • Author_Institution
    Oki Electr. Ind. Co. Ltd., Tokyo, Japan
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    342
  • Lastpage
    345
  • Abstract
    To examine the practicality of applying the chip-on-glass packaging technique to liquid-crystal-display (LCD) panels, the authors investigate how reliability is affected by different types of glass substrates and sealing resins, using 63% Sn-Pb solder for the bump contacts of a flip-chip. The results suggest that packaging failure can be reduced even when 63% Sn-Pb solder bump contacts are used as long as the glass substrate is properly selected. It is also confirmed that service life can be prolonged beyond that of a bare chip by proper materials selection and that expansion coefficient and longitudinal elastic constant are the most important factors in selecting the resin material
  • Keywords
    encapsulation; flip-chip devices; glass; liquid crystal displays; packaging; reliability; soldering; COG; LCD; SnPb solder; bump contacts; chip-on glass technology; environmental reliability; expansion coefficient; flip-chip; glass substrates; liquid-crystal-display; longitudinal elastic constant; materials selection; packaging; packaging failure; practicality; sealing resins; service life; Bonding; Glass; Joining processes; Packaging; Resins; Substrates; Temperature; Thermal expansion; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76171
  • Filename
    76171