DocumentCode :
2765103
Title :
The factors influencing environmental reliability of chip-on glass technology
Author :
Murakoshi, Kouichi ; Kanazawa, Jyunichi ; Ogata, Shigeyuki
Author_Institution :
Oki Electr. Ind. Co. Ltd., Tokyo, Japan
fYear :
1989
fDate :
26-28 Apr 1989
Firstpage :
342
Lastpage :
345
Abstract :
To examine the practicality of applying the chip-on-glass packaging technique to liquid-crystal-display (LCD) panels, the authors investigate how reliability is affected by different types of glass substrates and sealing resins, using 63% Sn-Pb solder for the bump contacts of a flip-chip. The results suggest that packaging failure can be reduced even when 63% Sn-Pb solder bump contacts are used as long as the glass substrate is properly selected. It is also confirmed that service life can be prolonged beyond that of a bare chip by proper materials selection and that expansion coefficient and longitudinal elastic constant are the most important factors in selecting the resin material
Keywords :
encapsulation; flip-chip devices; glass; liquid crystal displays; packaging; reliability; soldering; COG; LCD; SnPb solder; bump contacts; chip-on glass technology; environmental reliability; expansion coefficient; flip-chip; glass substrates; liquid-crystal-display; longitudinal elastic constant; materials selection; packaging; packaging failure; practicality; sealing resins; service life; Bonding; Glass; Joining processes; Packaging; Resins; Substrates; Temperature; Thermal expansion; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
Conference_Location :
Nara
Type :
conf
DOI :
10.1109/IEMTS.1989.76171
Filename :
76171
Link To Document :
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