DocumentCode :
2765198
Title :
Embedding of short-open calibration technique in commercial MoM simulators for parameter extraction of planar integrated circuits
Author :
Han, Liang ; Wu, Ke ; Hong, Wei ; Lin Li ; Chen, XiaoPing
Author_Institution :
Southeast Univ., Nanjing
fYear :
2006
fDate :
12-15 Dec. 2006
Firstpage :
1956
Lastpage :
1959
Abstract :
In this paper, the short-open calibration (SOC) technique, which was originally proposed, developed and self-contained in a research-oriented full-wave method of moments (MoM) simulator, is imbedded for the first time in a commercial simulator for the modeling and parameter extraction of planar integrated circuits and discontinuities. The SOC technique requires only two standards, namely short and open standards, which can be easily realized in commercial MoM simulators. By removing inherent numerical noise and errors, accurate equivalent circuit model of the circuits can be extracted and developed. Two examples are presented to verify the effectiveness of the proposed method in conjunction with a commercial package of choice.
Keywords :
calibration; circuit CAD; circuit simulation; method of moments; commercial MoM simulators; method of moments; parameter extraction; planar integrated circuits; short-open calibration; Calibration; Circuit simulation; Equivalent circuits; Integrated circuit modeling; Integrated circuit packaging; Microwave integrated circuits; Microwave theory and techniques; Millimeter wave integrated circuits; Parameter extraction; Solid modeling; Commercial package; Electro-magnetic simulators; Equivalent circuit model; MoM; Short-open calibration (SOC) technique;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. APMC 2006. Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-4-902339-08-6
Electronic_ISBN :
978-4-902339-11-6
Type :
conf
DOI :
10.1109/APMC.2006.4429792
Filename :
4429792
Link To Document :
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