Title :
Elimination of the dummy elements in thinned phased arrays
Author :
Beltran, F. ; King, F.
Author_Institution :
Raytheon Company, Wayland, MA, USA
Keywords :
Apertures; Error analysis; Failure analysis; Impedance; Mutual coupling; Phased arrays; Reactive power; Statistics;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1981
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/APS.1981.1148590
