Direct assessment of series resistance in thin film solar cells utilizing electroluminescence

The direct assessment method of series resistance of transparent conductive oxide (TCO) in thin film cells was proposed utilizing the line scan analysis of electroluminescence (EL) emission intensity. The line scan profile of EL intensity represents the series resistance in TCO, and the quantitative information can be obtained by simulating the line intensity profiles along the injection edge to the collection edge. The non-destructive assessment method in as-fabricated cells will be useful in designing the optimized structure to get high efficiency.