DocumentCode
2766366
Title
A novel hybrid propagation model
Author
Kunthong, Jakkrit ; Bunting, Charles F.
Author_Institution
Oklahoma State Univ., Stillwater, OK
fYear
2008
fDate
5-11 July 2008
Firstpage
1
Lastpage
4
Abstract
A proposed approach in this paper presents a potential model for predicting both path loss, RMS delay spread, and decay characteristics of a room propagation power delay profile. Several parameters are needed to construct the model, including the room volume, surface, and the average power reflected. A roompsilas average or total absorption rate is found using the impulse response sounder system based on high speed, high throughput RF detector circuit, a digital oscilloscope and a wireless sensor network. With this approach, a time efficient means for predicting a roompsilas path loss, RMS delay, and decay characteristics is reached. The sensors measure the impulse response and send the data back wirelessly over the network to the main computer. The software then calculates the data received in a matter of seconds and provides an average response of a room, path loss, and the RMS delay spread, which lead to inter symbol interference (ISI) of a certain wireless system being deployed in that particular room. Because the proposed model does not require any knowledge of the environment, not only does the method provide much richer information, which is statistically more accurate about the channel but it also implement a more cost effective way to compiling this information.
Keywords
delay estimation; intersymbol interference; radiowave propagation; RMS delay spread; hybrid propagation model; impulse response sounder system; intersymbol interference; path loss; total absorption rate; wireless sensor network; Absorption; Acoustic propagation; Circuits; Detectors; Power system modeling; Predictive models; Propagation delay; Propagation losses; Radio frequency; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-2041-4
Electronic_ISBN
978-1-4244-2042-1
Type
conf
DOI
10.1109/APS.2008.4619267
Filename
4619267
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