Title :
Ultrafast Infrared Spectrometry by the Beam Scanning across the PtSi Focal Plane Array
Author :
Saito, Mitsunori ; Okubo, Yuri
Author_Institution :
Ryukoku Univ., Otsu
Abstract :
Time-resolved infrared spectrometry was conducted by using a PtSi focal plane array. A reflection grating dispersed the probe beam in the horizontal direction, and a galvano - mirror scanned the beam in the vertical direction. Consequently, the spectral and temporal data could be measured by the two-dimensional PtSi array. The spectra of the flowing gases were measured in the 2.8-4.6- mum wavelength range at 80- mus intervals.
Keywords :
focal planes; infrared spectroscopy; platinum compounds; reflection; silicon; PtSi; beam scanning; focal plane array; galvano mirror; reflection grating; ultrafast infrared spectrometry; Diffraction gratings; Focusing; Gases; Infrared spectra; Lenses; Optical diffraction; Optical filters; Optical imaging; Spectroscopy; Wavelength measurement; focal plane array; gas sensing; infrared spectroscopy; time-resolved spectrometry;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2006 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
978-1-4244-0578-7
Electronic_ISBN :
978-1-4244-0578-7
DOI :
10.1109/COMMAD.2006.4429885
