DocumentCode :
2766891
Title :
Wafer-level hermetic packaging technology for MEMS using anodically-bondable LTCC wafer
Author :
Tanaka, Shuji ; Matsuzaki, Sakae ; Mohri, Mamoru ; Okada, Atsushi ; Fukushi, Hideyuki ; Esashi, Masayoshi
Author_Institution :
Tohoku Univ., Sendai, Japan
fYear :
2011
fDate :
23-27 Jan. 2011
Firstpage :
376
Lastpage :
379
Abstract :
This paper describes a versatile and reliable wafer-level hermetic packaging technology using an anodically-bondable low temperature cofired ceramic (LTCC) wafer, in which electrical feedthroughs and passive components can be embedded. The hermeticity of vacuum-sealed cavities was confirmed after 3000 cycles of heat shock (-40°C/+150°C, 30 min/30 min) by diaphragm method. The width of seal rings necessary for hermetic sealing of saw-diced chips is 0.1 mm or less. Electrical connection between MEMS on a Si wafer and feedthroughs in the LTCC wafer was established using Sn-containing metal stack simultaneously with anodic bonding. The developed wafer-level hermetic packaging technology is ready for practical applications.
Keywords :
bonding processes; ceramic packaging; elemental semiconductors; firing (materials); integrated circuit interconnections; micromechanical devices; sealing materials; silicon; wafer level packaging; LTCC wafer; MEMS; Si; Sn-containing metal stack; anodic bonding; electrical connection; hermetic sealing; low temperature cofired ceramic wafer; passive components; silicon wafer; vacuum-sealed cavities; wafer-level hermetic packaging; Bonding; Glass; Metals; Micromechanical devices; Packaging; Seals; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location :
Cancun
ISSN :
1084-6999
Print_ISBN :
978-1-4244-9632-7
Type :
conf
DOI :
10.1109/MEMSYS.2011.5734440
Filename :
5734440
Link To Document :
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