DocumentCode :
2766909
Title :
Hydrophobicity and leakage current statistics of polymeric insulators long-term exposed, to coastal contamination
Author :
Sörqvist, Torbjörn ; Vlastos, A.E.
Author_Institution :
Dept. of High Voltage Eng., Chalmers Univ. of Technol., Goteborg, Sweden
Volume :
1
fYear :
1996
fDate :
16-19 Jun 1996
Firstpage :
335
Abstract :
The hydrophobicity of polymeric insulators is crucial for their performance. This paper reports the hydrophobicity and the peak leakage current statistics of one porcelain, two ethylene-propylene-diene monomer (EPDM) and four silicone rubber (SIR) commercially available insulators. The insulators have been energized with a 130 kV RMS phase-to-ground AC voltage under identical outdoor conditions for more than seven years. The results presented show that under wet and polluted conditions the hydrophilic EPDM rubber insulators develop high leakage currents and substantial arcing. During a typical salt-storm the arcing amplitude of the EPDM rubber insulators is at least twice as high as that of the porcelain insulator. The SIR insulators, on the other hand, preserve a high degree of hydrophobicity after more than seven years in service and maintain very low leakage currents. However, the results show that during heavy salt-contaminated conditions, a highly stressed SIR insulator can temporarily lose its hydrophobicity and thereby develop considerable surface arcing.
Keywords :
polymer insulators; coastal contamination; ethylene-propylene-diene monomer rubber; hydrophobicity loss; insulation breakdown tests; long-term exposure tests; outdoor conditions; peak leakage current statistics; phase-to-ground AC voltage; polymeric insulators; porcelain; salt-storm; silicone rubber; surface arcing; Contamination; Environmentally friendly manufacturing techniques; Leakage current; Plastic insulation; Polymers; Porcelain; Rubber; Sea measurements; Statistics; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
ISSN :
1089-084X
Print_ISBN :
0-7803-3531-7
Type :
conf
DOI :
10.1109/ELINSL.1996.549350
Filename :
549350
Link To Document :
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