• DocumentCode
    2767115
  • Title

    Image understanding from thermal emission polarization

  • Author

    Wolff, Lawrence B. ; Lundberg, Andrew ; Tang, Renjie

  • Author_Institution
    Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
  • fYear
    1998
  • fDate
    23-25 Jun 1998
  • Firstpage
    625
  • Lastpage
    631
  • Abstract
    Existing polarization-based image understanding techniques use information only from reflected light. Apart from incandescent bodies thermally emitted light radiation from elements of a scene in the visible spectrum is insignificant. However, at longer wavelengths such as in the infrared thermal emission is typically quite prevalent from a number of scene elements of interest. FLIR imagery of both indoor and outdoor scenes reveals that many objects thermally emit a significant amount of radiation. Polarization from thermally emitting objects has been observed as long as 170 years ago from incandescent objects but since then there have only been a limited number of empirical investigations into this phenomenon. This paper presents a comprehensive model for explaining polarization of thermal emission from both rough and smooth surfaces, in agreement with empirical data, that can significantly enhance the image understanding of FLIR imagery. In particular it is possible to discern metal from dielectric materials under certain conditions, and from an accurate model for thermally emitted polarization it is possible to predictively model polarization signatures from CAD models of importance to automatic target recognition
  • Keywords
    dielectric materials; image recognition; polarisation; tracking; CAD models; FLIR imagery; dielectric materials; image understanding; infrared; metal; polarization signatures; target recognition; thermal emission; thermal emission polarization; Dielectric materials; Electromagnetic radiation; Electromagnetic wave polarization; Kelvin; Layout; Optical polarization; Predictive models; Rough surfaces; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 1998. Proceedings. 1998 IEEE Computer Society Conference on
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1063-6919
  • Print_ISBN
    0-8186-8497-6
  • Type

    conf

  • DOI
    10.1109/CVPR.1998.698670
  • Filename
    698670