DocumentCode :
2767369
Title :
Damage Mechanics and Experiments of Lead-free Solder Alloy
Author :
Zhou, Jun ; Hao, WeiNa ; Chai, GuoZhong
fYear :
2006
fDate :
6-8 Dec. 2006
Firstpage :
286
Lastpage :
289
Abstract :
Based on DSCM (digital speckle correlation method), a novel video control experimental technique was developed for assessing mechanical behavior of SnAgCu solder alloy. A series of experimental tests in tension on a SnAgCu solder alloy have been conducted under various constant strain rates ranging from 10E-5/s to 10E-3/s and at 298K to 423K. The experimental results have revealed the presence of both the nucleation and growth deformation mechanisms of voids. A viscoplastic constitutive model with void damage, including strain softening and strain hardening, was developed for analyzing the effect of voids on reliability of lead-free solders. Based on the Gurson-Tvergaard plastic potential equation and orthogonal rules, the void volume fraction was used as damage variable and was introduced into the material constitutive law to simulate the macroscopic mechanical response of SnAgCu solder alloy under different temperature and strain rates. The simulation results compared with the experimental measurements. The predictions have shown the ability of the viscoplastic model coupled with void damage to correctly describe the experimental observations: nonlinearity, strain rate sensitivity and void damage evolution are well captured.
Keywords :
copper alloys; deformation; mechanics; nucleation; silver alloys; solders; speckle; tin alloys; viscoplasticity; voids (solid); Gurson-Tvergaard plastic potential equation; SnAgCu; damage mechanics; digital speckle correlation; growth deformation; lead-free solder alloy; mechanical behavior; nucleation; strain hardening; strain rates; strain softening; video control; viscoplastic constitutive model; void damage; void volume fraction; Capacitive sensors; Correlation; Differential equations; Digital alloys; Environmentally friendly manufacturing techniques; Lead; Plastics; Softening; Speckle; Testing; Damage mechanics; SnAgCu solder; Void damage; constitutive model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2006 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
978-1-4244-0578-7
Electronic_ISBN :
978-1-4244-0578-7
Type :
conf
DOI :
10.1109/COMMAD.2006.4429938
Filename :
4429938
Link To Document :
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