DocumentCode
2767437
Title
Quality factor improvement of silicon nitride micro string resonators
Author
Schmid, S. ; Malm, B. ; Boisen, A.
Author_Institution
Dept. of Micro- & Nanotechnol., Tech. Univ. of Denmark, Lyngby, Denmark
fYear
2011
fDate
23-27 Jan. 2011
Firstpage
481
Lastpage
484
Abstract
Resonant micro and nano strings are of interest for sensor applications due to their extraordinary high quality factors, low mass and tunable resonant frequency. It has been found that the quality factor of strings is usually limited by clamping loss. In this work, clamping loss has been addressed by varying the clamping design and string geometry. We present silicon nitride micro strings with quality factors (Q) of up to 4 million in high vacuum achieved by minimizing clamping loss. For applications such as for chemical sensing, strings need to vibrate at atmospheric pressure. Maximal quality factor values in air were measured for the shortest strings with the highest resonant frequency having an optimal width to height ratio.
Keywords
clamps; damping; micromechanical resonators; silicon compounds; clamping loss; high quality factors; low mass; quality factor improvement; silicon nitride microstring resonators; tunable resonant frequency; Atmospheric measurements; Atmospheric modeling; Clamps; Damping; Q factor; Resonant frequency; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location
Cancun
ISSN
1084-6999
Print_ISBN
978-1-4244-9632-7
Type
conf
DOI
10.1109/MEMSYS.2011.5734466
Filename
5734466
Link To Document