• DocumentCode
    2767437
  • Title

    Quality factor improvement of silicon nitride micro string resonators

  • Author

    Schmid, S. ; Malm, B. ; Boisen, A.

  • Author_Institution
    Dept. of Micro- & Nanotechnol., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2011
  • fDate
    23-27 Jan. 2011
  • Firstpage
    481
  • Lastpage
    484
  • Abstract
    Resonant micro and nano strings are of interest for sensor applications due to their extraordinary high quality factors, low mass and tunable resonant frequency. It has been found that the quality factor of strings is usually limited by clamping loss. In this work, clamping loss has been addressed by varying the clamping design and string geometry. We present silicon nitride micro strings with quality factors (Q) of up to 4 million in high vacuum achieved by minimizing clamping loss. For applications such as for chemical sensing, strings need to vibrate at atmospheric pressure. Maximal quality factor values in air were measured for the shortest strings with the highest resonant frequency having an optimal width to height ratio.
  • Keywords
    clamps; damping; micromechanical resonators; silicon compounds; clamping loss; high quality factors; low mass; quality factor improvement; silicon nitride microstring resonators; tunable resonant frequency; Atmospheric measurements; Atmospheric modeling; Clamps; Damping; Q factor; Resonant frequency; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
  • Conference_Location
    Cancun
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-9632-7
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2011.5734466
  • Filename
    5734466