DocumentCode
2767704
Title
Temperature characteristics analysis of InGaP/InGaAs/Ge triple-junction solar cell under concentrated light using spice diode model
Author
Ota, Yasuyuki ; Sakurada, Yuya ; Nishioka, Kensuke
Author_Institution
Univ. of Miyazaki, Miyazaki, Japan
fYear
2010
fDate
20-25 June 2010
Abstract
Temperature characteristic analysis of the triple-junction solar cell was carried out using analysis function of the simulation program with integrated circuit emphasis (SPICE) under concentration conditions. Using the dark I-V characteristics of each single-junction solar cell (InGaP, InGaAs, Ge solar cells), the fitting of I-V curve and extraction of diode parameters were carried out. Xti of each solar cell was derived from the temperature dependence on the band gap. Extracted diode parameters and Xti were used in the equivalent circuit for triple-junction solar cell, and the open circuit voltages (Voc) at various temperatures under the various concentration ratios were calculated. Concentrated ratios evaluated in this study were 1, 7 and 14 suns, respectively. The calculated value corresponded to the measured value. We analysed the temperature characteristics of triple-junction solar cells using SPICE diode model. Measured and calculated I-V characteristics for triple-junction solar cells agreed well at various temperatures under low concentration ratios. It is considered that this method can be applied to the output estimation of single-junction and multi-junction solar cells under the various temperatures and concentration ratios.
Keywords
III-V semiconductors; SPICE; energy gap; equivalent circuits; gallium arsenide; gallium compounds; germanium; indium compounds; semiconductor diodes; solar cells; InGaP-InGaAs-Ge; SPICE diode model; band gap; concentrated light; dark I-V characteristics; equivalent circuit; open circuit voltages; temperature characteristics analysis; triple-junction solar cell;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5616163
Filename
5616163
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