DocumentCode :
2767704
Title :
Temperature characteristics analysis of InGaP/InGaAs/Ge triple-junction solar cell under concentrated light using spice diode model
Author :
Ota, Yasuyuki ; Sakurada, Yuya ; Nishioka, Kensuke
Author_Institution :
Univ. of Miyazaki, Miyazaki, Japan
fYear :
2010
fDate :
20-25 June 2010
Abstract :
Temperature characteristic analysis of the triple-junction solar cell was carried out using analysis function of the simulation program with integrated circuit emphasis (SPICE) under concentration conditions. Using the dark I-V characteristics of each single-junction solar cell (InGaP, InGaAs, Ge solar cells), the fitting of I-V curve and extraction of diode parameters were carried out. Xti of each solar cell was derived from the temperature dependence on the band gap. Extracted diode parameters and Xti were used in the equivalent circuit for triple-junction solar cell, and the open circuit voltages (Voc) at various temperatures under the various concentration ratios were calculated. Concentrated ratios evaluated in this study were 1, 7 and 14 suns, respectively. The calculated value corresponded to the measured value. We analysed the temperature characteristics of triple-junction solar cells using SPICE diode model. Measured and calculated I-V characteristics for triple-junction solar cells agreed well at various temperatures under low concentration ratios. It is considered that this method can be applied to the output estimation of single-junction and multi-junction solar cells under the various temperatures and concentration ratios.
Keywords :
III-V semiconductors; SPICE; energy gap; equivalent circuits; gallium arsenide; gallium compounds; germanium; indium compounds; semiconductor diodes; solar cells; InGaP-InGaAs-Ge; SPICE diode model; band gap; concentrated light; dark I-V characteristics; equivalent circuit; open circuit voltages; temperature characteristics analysis; triple-junction solar cell;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5616163
Filename :
5616163
Link To Document :
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