In-situ XRD investigation on phase transition of CdTe thin films during a CdCl2 heat treatment

In order to investigate the effect of CdCl₂ heat treatment on the physical properties of the CdTe thin films grown by a sputtering method, the CdTe thin films were coated with CdCl₂. The recrystallisation, grain growth and randomization were investigated by monitoring the phase transition of CdCl₂ heat treated CdTe specimens during temperature ramp annealed using in situ high-temperature X-ray diffraction. The result shows that the recrystallisation of the CdTe(111) texture and other textures does not occur simultaneously but sequencially. The XRD data shows there was no overlapped temperature region for recrystallisation between (111) and other textures.