• DocumentCode
    2768370
  • Title

    Very high stability achievement in MEMS based AC voltage references

  • Author

    Blard, F. ; Bounouh, A. ; Bélières, D. ; Camon, H.

  • Author_Institution
    LNE, Lab. Nat. de Metrol. et d´´Essais, Trappes, France
  • fYear
    2011
  • fDate
    23-27 Jan. 2011
  • Firstpage
    656
  • Lastpage
    659
  • Abstract
    This paper presents the high-level of stability of voltage references operated in alternating current (AC) and based on the pull-in effect in split-fingers MEMS architectures. Our work deals with the design and fabrication of new MEMS devices and presents results of both electrical and mechanical characterizations as well as the development of an optimized read-out electronics showing a mature stage of this technology to be rapidly implemented in various applications. The new aspects in this paper are related to the new architecture of the MEMS allowing to minimize the effect of leakage capacitances on the stability of the voltage reference and to avoid to compensate any “built-in voltage” generated at metal-semiconductor interfaces.
  • Keywords
    micromechanical devices; readout electronics; semiconductor-metal boundaries; AC voltage references; MEMS devices; leakage capacitances; metal-semiconductor interfaces; optimized read-out electronics; pull-in effect; split-fingers MEMS architectures; Electrodes; Micromechanical devices; Stability criteria; Standards; Temperature measurement; Thermal stability; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
  • Conference_Location
    Cancun
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-9632-7
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2011.5734510
  • Filename
    5734510