Title :
The implementation of DSP in test and measurement equipment
Author_Institution :
Instrument Div., Tektronix, Marlow, UK
Abstract :
The author discusses the impact of the first availability of DSP devices fully integrated into oscilloscope systems and the way in which they can potentially change the traditional expectations of oscilloscope measurement techniques
Keywords :
cathode-ray oscilloscopes; digital instrumentation; digital signal processing chips; DSP devices; FFT; cathode ray oscilloscope; digital instrumentation; digital signal processor; oscilloscope measurement; test;
Conference_Titel :
DSP (Digital Signal Processing) in Instrumentation, IEE Colloquium on (Digest No.009)
Conference_Location :
London
