Title :
The design of a multi-sine LCR component meter
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Wales, Swansea, UK
Abstract :
The author introduces the concept of multi-sine component testing of components in a LCR component meter. The results obtained compare favourably with those for single frequency excitation providing a `quick look´ facility for the user testing components or systems. Because the instrument includes single frequency excitation as well, no concession is made to accuracy of measurement. The complexity and number of results ensuing from this approach called for a radical departure from existing displays. A virtual instrument design philosophy was adopted to meet this requirement
Keywords :
capacitance measurement; electric resistance measurement; electronic equipment testing; inductance measurement; cross spectral analysis; multi-sine LCR component meter; signal source; single frequency excitation; sinusoidal test; virtual measurement;
Conference_Titel :
DSP (Digital Signal Processing) in Instrumentation, IEE Colloquium on (Digest No.009)
Conference_Location :
London