Title :
A linear-time eigenvalue solver for finite-element-based analysis of large-scale wave propagation problems in on-chip interconnect structures
Author :
Lee, Jongwon ; Balakrishnan, Venkataramanan ; Koh, Cheng-Kok ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
Abstract :
In this paper the analysis and design of next-generation VLSI circuits using accurate electromagnetics-based models result in numerical problems of very large scale is presented. Typically, the solution of a problem with N parameters requires at least O(N) computation. With next generation VLSI circuits, however, even O(N) is prohibitively high since N is very large. The method that partially addresses this issue was developed for full-wave modeling of large-scale interconnect structures. In this method, a number of seeds (a seed has a unique cross section) are first recognized from an interconnect structure. In each seed, the original wave propagation problem is represented as a generalized eigenvalue problem. The complexity of solving 3D interconnects of O(N) is then overcome by seeking the solution of a few 2D seeds, which is then post-processed to obtain the solution of the original 3D problem through the development of an on-chip mode-matching technique. The computational bottleneck is the solution of a generalized eigenvalue problem. Efficient algorithms such as ARPACK [2] still require O(M2) storage and operations due to a dense matrix-vector multiplication. We present an algorithm that provides a solution to the generalized eigenvalue problem with O(M) complexity, thus paving the way for the full-wave simulation of next generation VLSI circuits.
Keywords :
VLSI; eigenvalues and eigenfunctions; finite element analysis; integrated circuit interconnections; matrix algebra; 2D seeds; 3D interconnects; electromagnetics-based models; finite-element-based analysis; large-scale wave propagation problems; linear-time eigenvalue solver; matrix-vector multiplication; next-generation VLSI circuits; on-chip interconnect structures; on-chip mode-matching technique; Circuit simulation; Eigenvalues and eigenfunctions; Electromagnetic analysis; Electromagnetic modeling; Electromagnetic propagation; Finite element methods; Integrated circuit interconnections; Large-scale systems; Numerical models; Very large scale integration;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2041-4
Electronic_ISBN :
978-1-4244-2042-1
DOI :
10.1109/APS.2008.4619427