• DocumentCode
    2769158
  • Title

    Interpolation of high frequency data by using matrix pencil and Greens’s function

  • Author

    Jie Yang ; Taylor, M.C. ; Yu Zhang ; Sarkar, T.K.

  • Author_Institution
    Dept. of EECS, Syracuse Univ., Syracuse, NY
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper a novel interpolation approach is proposed to reduce the number of samples required for system response reconstruction. We explore the effect of complex exponential term e-jkr (which is the numerator part of Greenpsilas function) in electromagnetic field, which causes the oscillation in system response especially in the high frequency domain. If it is divided from the field quantity, even though the magnitude is unchanged, both real and imaginary parts of the frequency response become smoother. The interpolation is performed separately for both real and imaginary parts so that the sample rate required for accurate reconstruction is significantly reduced. The interpolation is carried out by matrix pencil method and the coefficients of which are calculated by using the total least square (TLS) implementation to improve the accuracy. Numerical examples are presented to illustrate the applicability of this unique approach in ultra-high frequency bands.
  • Keywords
    Green´s function methods; computational electromagnetics; electromagnetic fields; frequency response; frequency-domain analysis; interpolation; least squares approximations; matrix algebra; Greens´s function; Interpolation frequency response smoothing approach; electromagnetic field; frequency domain solver; high frequency data; interpolation approach; matrix pencil method; system response reconstruction; total least square implementation; Frequency domain analysis; Frequency response; Hafnium; Image reconstruction; Interpolation; Oscillators; Smoothing methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Type

    conf

  • DOI
    10.1109/APS.2008.4619433
  • Filename
    4619433