DocumentCode :
2769556
Title :
Aemulus
fYear :
2008
fDate :
1-3 Dec. 2008
Firstpage :
1
Lastpage :
1
Keywords :
Algorithm design and analysis; Consumer electronics; Costs; Electronic equipment testing; Integrated circuit testing; Navigation; Radio frequency; Semiconductor device testing; System testing; Technological innovation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, 2008. ICED 2008. International Conference on
Conference_Location :
Penang, Malaysia
Print_ISBN :
978-1-4244-2315-6
Electronic_ISBN :
978-1-4244-2315-6
Type :
conf
DOI :
10.1109/ICED.2008.4786617
Filename :
4786617
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2769556
