• DocumentCode
    2769633
  • Title

    Semantic translation error rate for evaluating translation systems

  • Author

    Subramanian, Krishna ; Stallard, Dave ; Prasad, Rohit ; Saleem, Shirin ; Natarajan, Prem

  • Author_Institution
    BBN Technol., Cambridge
  • fYear
    2007
  • fDate
    9-13 Dec. 2007
  • Firstpage
    390
  • Lastpage
    395
  • Abstract
    In this paper, we introduce a new metric which we call the semantic translation error rate, or STER, for evaluating the performance of machine translation systems. STER is based on the previously published translation error rate (TER) (Snover et al., 2006) and METEOR (Banerjee and Lavie, 2005) metrics. Specifically, STER extends TER in two ways: first, by incorporating word equivalence measures (WordNet and Porter stemming) standardly used by METEOR, and second, by disallowing alignments of concept words to non-concept words (aka stop words). We show how these features make STER alignments better suited for human-driven analysis than standard TER. We also present experimental results that show that STER is better correlated to human judgments than TER. Finally, we compare STER to METEOR, and illustrate that METEOR scores computed using the STER alignments have similar statistical properties to METEOR scores computed using METEOR alignments.
  • Keywords
    error statistics; language translation; performance evaluation; software metrics; METEOR; Porter stemming; STER alignments; WordNet; human-driven analysis; machine translation systems; semantic translation error rate; translation systems evaluation; word equivalence measures; Costs; Error analysis; Globalization; Humans; Information analysis; Information technology; Investments; Natural languages; Surface-mount technology; Web sites; Automated Metric; Statistical Machine Translation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Speech Recognition & Understanding, 2007. ASRU. IEEE Workshop on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-1746-9
  • Electronic_ISBN
    978-1-4244-1746-9
  • Type

    conf

  • DOI
    10.1109/ASRU.2007.4430144
  • Filename
    4430144