DocumentCode :
2769808
Title :
Calibration of propagation delay of flip-flops
Author :
Ragheb, Tamer ; Marshall, Andrew
Author_Institution :
Adv. CMOS Technol. Dev., Texas Instrum., Dallas, TX, USA
fYear :
2012
fDate :
12-14 Sept. 2012
Firstpage :
376
Lastpage :
380
Abstract :
Although they are a relatively small proportion of the total number of logic gates in a logic path, latches and flip-flops add significantly to the total timing path delay of many logic paths, due to the significant cell delay time they introduce. We introduce new circuitry to isolate and accurately measure propagation delays in flip-flops and other non-simple logic structures in use at 45nm process nodes and beyond.
Keywords :
calibration; flip-flops; logic gates; cell delay time; flip-flops; logic gates; logic path delay; logic structures; propagation delay calibration; size 45 nm; Clocks; Delay; Flip-flops; Inverters; Logic gates; Ring oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference (SOCC), 2012 IEEE International
Conference_Location :
Niagara Falls, NY
ISSN :
2164-1676
Print_ISBN :
978-1-4673-1294-3
Type :
conf
DOI :
10.1109/SOCC.2012.6398339
Filename :
6398339
Link To Document :
بازگشت