DocumentCode
2769808
Title
Calibration of propagation delay of flip-flops
Author
Ragheb, Tamer ; Marshall, Andrew
Author_Institution
Adv. CMOS Technol. Dev., Texas Instrum., Dallas, TX, USA
fYear
2012
fDate
12-14 Sept. 2012
Firstpage
376
Lastpage
380
Abstract
Although they are a relatively small proportion of the total number of logic gates in a logic path, latches and flip-flops add significantly to the total timing path delay of many logic paths, due to the significant cell delay time they introduce. We introduce new circuitry to isolate and accurately measure propagation delays in flip-flops and other non-simple logic structures in use at 45nm process nodes and beyond.
Keywords
calibration; flip-flops; logic gates; cell delay time; flip-flops; logic gates; logic path delay; logic structures; propagation delay calibration; size 45 nm; Clocks; Delay; Flip-flops; Inverters; Logic gates; Ring oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference (SOCC), 2012 IEEE International
Conference_Location
Niagara Falls, NY
ISSN
2164-1676
Print_ISBN
978-1-4673-1294-3
Type
conf
DOI
10.1109/SOCC.2012.6398339
Filename
6398339
Link To Document