Design of Resolution Adaptive TIQ Flash ADC using AMS 0.35μm technology

Author

Rajashekar, G. ; Bhat, M.S.

Author_Institution

Dept. of Electron. & Commun. Eng., NITK Surathkal, Mangalore

fYear

2008

fDate

1-3 Dec. 2008

Firstpage

1

Lastpage

6

Abstract

This paper presents a Resolution Adaptive Flash A/D Converter design and its performance. To achieve high speed, the proposed A/D converter utilizes Threshold Inverter Quantization technique replacing conventional analog comparators with digital comparators. The replacement results in a faster digital conversion and a reduction of the analog nodes in the ADC. The proposed ADC is a true variable resolution ADC, operates at 3-bit, 4-bit, 5-bit and 6-bit precision depending on control inputs. The proposed ADC is designed with AMS 0.35 mum CMOS technology and 3.3 V power supply voltage and a prototype chip is fabricated. Simulation results and test results are presented.

Keywords

CMOS integrated circuits; analogue-digital conversion; comparators (circuits); AMS CMOS technology; conventional analog comparators; digital comparators; prototype chip; resolution adaptive TIQ flash A-D converter; size 0.35 mum; storage capacity 3 bit; storage capacity 4 bit; storage capacity 5 bit; storage capacity 6 bit; threshold inverter quantization technique; voltage 3.3 V; Analog-digital conversion; CMOS technology; Design engineering; Energy consumption; Inverters; Prototypes; Quantization; Resistors; Threshold voltage; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Design, 2008. ICED 2008. International Conference on

Conference_Location

Penang

Print_ISBN

978-1-4244-2315-6

Electronic_ISBN

978-1-4244-2315-6

Type

conf

DOI

10.1109/ICED.2008.4786654

Filename

4786654