Title :
Mutation-analysis driven functional verification of a soft microprocessor
Author :
Xie, Tao ; Mueller, Wolfgang ; Letombe, Florian
Author_Institution :
C-Lab., Univ. of Paderborn, Paderborn, Germany
Abstract :
This paper proposes a quality driven, simulation based approach to functional design verification, which applies mainly to IP-level HDL designs with well specified test instruction format and is evaluated on a soft microprocessor core MB-LITE [5]. The approach utilizes mutation analysis as the quality metric to steer an automated simulation data generation process. It leads to a simulation flow with two phases towards an enhanced mutation analysis result. First in a random simulation phase, an in-loop heuristics is deployed and adjusts dynamically the test probability distribution so as to improve the coverage efficiency. Next, for each remaining hard-to-kill mutant, a search heuristics on test input space is developed to iteratively locate a target test, using a specific objective cost function for the goal of killing HDL mutant. The effectiveness of this integrated two-phase simulation flow is demonstrated by the results with the MB-LITE microprocessor IP.
Keywords :
formal verification; hardware description languages; integrated circuit design; integrated circuit testing; microprocessor chips; HDL mutant killing; IP level HDL designs; MB-LITE microprocessor IP; functional design verification; mutation analysis driven functional verification; objective cost function; quality driven; simulation flow; soft microprocessor; Analytical models; Cost function; Data models; Hardware design languages; IP networks; Microprocessors; Search problems;
Conference_Titel :
SOC Conference (SOCC), 2012 IEEE International
Conference_Location :
Niagara Falls, NY
Print_ISBN :
978-1-4673-1294-3
DOI :
10.1109/SOCC.2012.6398362