DocumentCode :
2770331
Title :
Development of ZnO thin films for SAW devices by the ultrasonic spray pyrolysis technique
Author :
Kim, Hagbong ; Lee, Youngjin ; Roh, Yongrae ; Jinyoung Jung ; Lee, Manhyeong ; Kwon, Hyukchae
Author_Institution :
Dept. of Sensor Eng., Kyungpook Nat. Univ., Taegu, South Korea
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
323
Abstract :
ZnO thin films for use in SAW filters have been prepared on SiO 2/Si substrates by the ultrasonic spray pyrolysis technique. Thickness of the films has been determined through a SAW propagation simulation on the substrate as 8000 Å for the ZnO and 5000 Å for the SiO2 at which the coupling factor and the Rayleigh wave velocity are 0.9% and 2900 m/sec, respectively. For use in SAW filters, the ZnO thin film should have high resistivity and strong piezoelectric activity, i.e., good c-axis orientation. For simultaneous achievement of the two desired properties, we have rigorously investigated the effects of various deposition parameters through experiments. The optimal deposition conditions have been determined as a substrate temperature of 430°C, a zinc acetate solution of 0.05 M doped with 20 atomic percent of LiCl, a flow rate of 2.5 ml/min., reactor pressure of 3 Torr, and annealing and cooling down in oxygen environment. Deposited ZnO thin films show good thickness uniformity over a 4" wafer, have c-axis orientation ratio over 99%, and have resistivity of the order of 109 ohm·m
Keywords :
II-VI semiconductors; Rayleigh waves; annealing; piezoelectric semiconductors; semiconductor thin films; spray coating techniques; surface acoustic wave filters; zinc compounds; 430 degC; Rayleigh wave velocity; SAW filters; SAW propagation simulation; Si; SiO2; SiO2/Si substrates; ZnO; annealing; c-axis orientation; coupling factor; piezoelectric activity; resistivity; substrate temperature; thickness uniformity; thin films; ultrasonic spray pyrolysis; Conductivity; Piezoelectric films; SAW filters; Semiconductor thin films; Spraying; Substrates; Surface acoustic wave devices; Surface acoustic waves; Thin film devices; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
ISSN :
1051-0117
Print_ISBN :
0-7803-4095-7
Type :
conf
DOI :
10.1109/ULTSYM.1998.762156
Filename :
762156
Link To Document :
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