DocumentCode :
2770838
Title :
An analysis of frequency temperature characteristics and electrical equivalent circuit parameters of a new shape GT cut quartz crystal resonator formed by an etching method
Author :
Kawashima, Hirofumi
Author_Institution :
Seiko Electron. Components Ltd., Tochigi, Japan
fYear :
1989
fDate :
3-6 Oct 1989
Firstpage :
465
Abstract :
The author presents a theoretical and experimental study of the frequency-temperature behavior and electrical characteristics of a GT-cut quartz crystal resonator with the two supporting portions at both ends of the vibrational portion which couples width-extensional vibration and length-extensional vibration. It is clarified why the GT cut quartz crystal resonator has better frequency-temperature characteristics than the conventional GT plate. An electrical equivalent circuit of a GT-cut quartz crystal resonator with electrical coupling and elastic internal coupling, which is a coupling quartz crystal resonator, is proposed. The electrical equivalent-circuit parameters of the present GT-cut quartz crystal resonator are discussed. Because the present GT-cut quartz crystal resonator has a very small coupling factor of about 3%, the principal vibration and the subvibration can be treated independently. Based on this result, the equivalent-circuit parameters of the resonator have been analyzed theoretically and the results are compared with the measured data. The calculated results agree well with the measured values
Keywords :
crystal resonators; piezoelectric oscillations; quartz; GT-cut quartz crystal resonator; coupling factor; elastic internal coupling; electrical characteristics; electrical equivalent circuit; etching method; frequency-temperature behavior; length-extensional vibration; subvibration; width-extensional vibration; Capacitance; Coupling circuits; Electrodes; Equations; Equivalent circuits; Etching; Resonant frequency; Shape; Temperature; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
Conference_Location :
Montreal, Que.
Type :
conf
DOI :
10.1109/ULTSYM.1989.67028
Filename :
67028
Link To Document :
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