• DocumentCode
    2770876
  • Title

    Design of near threshold All Digital Delay Locked Loops

  • Author

    Sadi, Mehdi ; Stan, Mircea

  • Author_Institution
    Electr. & Comput. Eng., Univ. of Virginia Charlottesville, Charlottesville, VA, USA
  • fYear
    2012
  • fDate
    12-14 Sept. 2012
  • Firstpage
    137
  • Lastpage
    142
  • Abstract
    In this paper we present a detailed methodology for designing ultra low power All Digital Delay Locked Loops (ADDLL) operating at Near Threshold Voltage (NTV). We address the design constraints - increased gate delays, design corner vulnerability and duty cycle mismatch - in scaled Vdd design. Circuit level enhancement techniques are presented to circumvent these issues. We also eliminate the false locking and dithering problems. Finally, based on our methodology, we designed and simulated an ADDLL in a 45nm PDK operating at 0.8-1GHz with 0.5 V supply.
  • Keywords
    delay lock loops; digital circuits; ADDLL design; NTV; PDK; circuit level enhancement technique; corner vulnerability; duty cycle mismatch; frequency 0.8 GHz to 1 GHz; gate delays; locking-dithering problems; near threshold voltage; near-threshold all-digital delay-locked loop design; size 45 nm; ultralow-power all-digital delay-locked loop design; voltage 0.5 V; Capacitance; Clocks; Delay; Delay lines; Detectors; Inverters; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2012 IEEE International
  • Conference_Location
    Niagara Falls, NY
  • ISSN
    2164-1676
  • Print_ISBN
    978-1-4673-1294-3
  • Type

    conf

  • DOI
    10.1109/SOCC.2012.6398398
  • Filename
    6398398