DocumentCode
2770876
Title
Design of near threshold All Digital Delay Locked Loops
Author
Sadi, Mehdi ; Stan, Mircea
Author_Institution
Electr. & Comput. Eng., Univ. of Virginia Charlottesville, Charlottesville, VA, USA
fYear
2012
fDate
12-14 Sept. 2012
Firstpage
137
Lastpage
142
Abstract
In this paper we present a detailed methodology for designing ultra low power All Digital Delay Locked Loops (ADDLL) operating at Near Threshold Voltage (NTV). We address the design constraints - increased gate delays, design corner vulnerability and duty cycle mismatch - in scaled Vdd design. Circuit level enhancement techniques are presented to circumvent these issues. We also eliminate the false locking and dithering problems. Finally, based on our methodology, we designed and simulated an ADDLL in a 45nm PDK operating at 0.8-1GHz with 0.5 V supply.
Keywords
delay lock loops; digital circuits; ADDLL design; NTV; PDK; circuit level enhancement technique; corner vulnerability; duty cycle mismatch; frequency 0.8 GHz to 1 GHz; gate delays; locking-dithering problems; near threshold voltage; near-threshold all-digital delay-locked loop design; size 45 nm; ultralow-power all-digital delay-locked loop design; voltage 0.5 V; Capacitance; Clocks; Delay; Delay lines; Detectors; Inverters; Radiation detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference (SOCC), 2012 IEEE International
Conference_Location
Niagara Falls, NY
ISSN
2164-1676
Print_ISBN
978-1-4673-1294-3
Type
conf
DOI
10.1109/SOCC.2012.6398398
Filename
6398398
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