• DocumentCode
    2771110
  • Title

    Characterization of microfabricated shear stress sensors

  • Author

    Pan, Tao ; Hyman, Daniel ; Mehregany, Mehran ; Reshotko, Eli ; Willis, Briain

  • Author_Institution
    Dept. of Electr. Eng. & Appl. Phys., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    1995
  • fDate
    18-21 Jul 1995
  • Firstpage
    42522
  • Lastpage
    42528
  • Abstract
    This paper reports a dual effort to fabricate and calibrate micromachined shear stress sensors for wind tunnel instrumentation. Our team at CWRU has designed and fabricated both active and passive shear stress sensors based on microfabricated polysilicon lateral resonant structures. In addition to this effort, we have collaborated with Analog Devices to develop shear stress sensors with integrated electronics based on existing accelerometer devices and process technology. Sensors from both efforts have been tested in a macroscopic flow channel for characterization in compressible flow. The sensors from CWRU were optically calibrated at 9 Pa/μm of floating element deflection. The integrated sensors demonstrated a nominal sensitivity of 6 Pa/V. Packaging issues were found to be critical for proper sensor design and calibration. Misalignment of a few degrees from parallel to the fluid flow results in an order of magnitude difference in integrated sensor output
  • Keywords
    accelerometers; calibration; compressible flow; elemental semiconductors; flow measurement; microsensors; silicon; wind tunnels; Si; accelerometer devices; calibration; compressible flow; floating element deflection; integrated electronics; macroscopic flow channel; microfabricated shear stress sensors; nominal sensitivity; packaging issues; polysilicon lateral resonant structures; wind tunnel instrumentation; Accelerometers; Calibration; Collaboration; Instruments; Optical sensors; Packaging; Resonance; Sensor phenomena and characterization; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation in Aerospace Simulation Facilities, 1995. ICIASF '95 Record., International Congress on
  • Conference_Location
    Wright-Patterson AFB, OH
  • Print_ISBN
    0-7803-2088-3
  • Type

    conf

  • DOI
    10.1109/ICIASF.1995.519112
  • Filename
    519112