DocumentCode
2771315
Title
Self-engaging and disengaging CMOS-MEMS probes
Author
Draghi, Louis J. ; Bain, James A. ; Fedder, Gary K.
Author_Institution
Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2011
fDate
23-27 Jan. 2011
Firstpage
1273
Lastpage
1276
Abstract
CMOS-MEMS probes have the ability to interact with external surfaces mechanically and electrically through their conductive tips. Using only the electrothermal actuator of the probe, micro-Newton forces can be applied to make active probe contact with a conductive substrate. Measured cyclic contact resistance has a mean value of 7.4 kΩ and a standard deviation of 11.3 kΩ over 2450 cycles. When the probe actuator is repeatedly turned off, mechanical and electrical contacts are successfully disconnected. Piezoresistive sensors embedded within the probe cantilevers possess a resolution of 44 nm to detect when the tip has come into physical contact with an experimental surface and provide force feedback.
Keywords
CMOS integrated circuits; cantilevers; electrical contacts; mechanical contact; micromechanical devices; piezoresistive devices; probes; CMOS-MEMS probes; conductive substrate; conductive tips; cyclic contact resistance; electrical contact; electrothermal actuator; force feedback; mechanical contact; microNewton forces; piezoresistive sensors; probe cantilevers; size 44 nm; Actuators; Bridge circuits; Contacts; Piezoresistance; Platinum; Probes; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location
Cancun
ISSN
1084-6999
Print_ISBN
978-1-4244-9632-7
Type
conf
DOI
10.1109/MEMSYS.2011.5734665
Filename
5734665
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