DocumentCode :
2771323
Title :
Variation tolerant high resolution and low latency time-to-digital converter
Author :
Henzler, S. ; Koeppe, S. ; Lorenz, D. ; Kamp, W. ; Kuenemund, R. ; Schmitt-Landsiedel, D.
Author_Institution :
Infineon Technol. AG, Munich
fYear :
2007
fDate :
11-13 Sept. 2007
Firstpage :
194
Lastpage :
197
Abstract :
A high resolution time-to-digital converter (TDC) with low latency and low deadtime is proposed. A coarse time quantization derived from a differential inverter delay line is locally interpolated with passive voltage dividers. The high resolution TDC is monotonic by construction which makes the concept very robust against process variations. The feasibility is demonstrated with an 8-bit TDC with a resolution of 0.25 inverter delays in a 90 nm low power CMOS technology. The resolution limits imposed by clock uncertainty and local variations are derived theoretically.
Keywords :
CMOS integrated circuits; convertors; quantisation (signal); coarse time quantization; differential inverter delay line; low power CMOS technology; passive voltage dividers; size 90 nm; time-to-digital converter; variation tolerant; word length 8 bit; CMOS technology; Circuits; Delay effects; Delay lines; Interpolation; Pulse width modulation inverters; Quantization; Signal resolution; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference, 2007. ESSCIRC 2007. 33rd European
Conference_Location :
Munich
ISSN :
1930-8833
Print_ISBN :
978-1-4244-1125-2
Type :
conf
DOI :
10.1109/ESSCIRC.2007.4430278
Filename :
4430278
Link To Document :
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