DocumentCode
2771733
Title
Gate bias circuit for an SCCMOS power switch achieving maximum leakage reduction
Author
Valentian, Alexandre ; Beigne, Edith
Author_Institution
CEA-LETI, MINATEC, Grenoble
fYear
2007
fDate
11-13 Sept. 2007
Firstpage
300
Lastpage
303
Abstract
Power switch transistors are very effective in cutting leakage currents of digital circuits in standby mode. Moreover, among the existing power switch transistors, SCCMOS is the most suited to a low-VDD environment since it uses a Iow-VTH transistor. This power switch type achieves good leakage reduction results, provided that an optimal voltage is applied on its gate in order to maximize the leakage gain. This optimal voltage value, depending on the operating conditions (process, voltage, temperature), cannot be determined at the design level. We have therefore designed and fabricated a polarization circuit that automatically finds the optimal bias voltage whatever the environment conditions. This circuit, realized in STMicroelectronics bulk 65 nm technology, achieves more than two decades leakage current reduction at the power switch level, for a power dissipation overhead of 45 nW at ambient temperature.
Keywords
CMOS digital integrated circuits; leakage currents; low-power electronics; polarisation; power transistors; SCCMOS power switch; STMicroelectronics bulk 65 nm technology; digital circuits; gate bias circuit; leakage current; leakage reduction; optimal bias voltage; polarization circuit; power 45 nW; power dissipation overhead; power switch transistors; size 65 nm; standby mode; CMOS technology; Digital circuits; Leakage current; MOSFETs; Polarization; Subthreshold current; Switches; Switching circuits; Temperature dependence; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Circuits Conference, 2007. ESSCIRC 2007. 33rd European
Conference_Location
Munich
ISSN
1930-8833
Print_ISBN
978-1-4244-1125-2
Type
conf
DOI
10.1109/ESSCIRC.2007.4430303
Filename
4430303
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