• DocumentCode
    2771733
  • Title

    Gate bias circuit for an SCCMOS power switch achieving maximum leakage reduction

  • Author

    Valentian, Alexandre ; Beigne, Edith

  • Author_Institution
    CEA-LETI, MINATEC, Grenoble
  • fYear
    2007
  • fDate
    11-13 Sept. 2007
  • Firstpage
    300
  • Lastpage
    303
  • Abstract
    Power switch transistors are very effective in cutting leakage currents of digital circuits in standby mode. Moreover, among the existing power switch transistors, SCCMOS is the most suited to a low-VDD environment since it uses a Iow-VTH transistor. This power switch type achieves good leakage reduction results, provided that an optimal voltage is applied on its gate in order to maximize the leakage gain. This optimal voltage value, depending on the operating conditions (process, voltage, temperature), cannot be determined at the design level. We have therefore designed and fabricated a polarization circuit that automatically finds the optimal bias voltage whatever the environment conditions. This circuit, realized in STMicroelectronics bulk 65 nm technology, achieves more than two decades leakage current reduction at the power switch level, for a power dissipation overhead of 45 nW at ambient temperature.
  • Keywords
    CMOS digital integrated circuits; leakage currents; low-power electronics; polarisation; power transistors; SCCMOS power switch; STMicroelectronics bulk 65 nm technology; digital circuits; gate bias circuit; leakage current; leakage reduction; optimal bias voltage; polarization circuit; power 45 nW; power dissipation overhead; power switch transistors; size 65 nm; standby mode; CMOS technology; Digital circuits; Leakage current; MOSFETs; Polarization; Subthreshold current; Switches; Switching circuits; Temperature dependence; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference, 2007. ESSCIRC 2007. 33rd European
  • Conference_Location
    Munich
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-1125-2
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2007.4430303
  • Filename
    4430303