Title :
IEE Colloquium on `Automated Testing and Software Solutions´ (Digest No.081)
Abstract :
The following topics were dealt with: automated signal capture and waveform analysis; knowledge representation automation for functional tests; automatic test generation and fault diagnosis of boundary scan circuits; feedforward strategy for online quality control; software tools for ATE; quality function deployment in testing; software automation and constraints management; quality software solutions; and ASIC design using scan path and JTAG techniques
Keywords :
automatic test equipment; automatic testing; fault location; knowledge representation; quality control; software tools; ASIC design; ATE; JTAG; automated signal capture; automatic test generation; boundary scan circuits; constraints management; fault diagnosis; feedforward strategy; functional tests; knowledge representation automation; online quality control; quality function; scan path; software automation; software tools; testing; waveform analysis;
Conference_Titel :
Automated Testing and Software Solutions, IEE Colloquium on
Conference_Location :
London
