• DocumentCode
    2772045
  • Title

    Low loss multilayer frequency selective surface negative index metamaterials for the mid-infrared

  • Author

    Bossard, Jeremy A. ; Yun, Seokho ; Werner, Douglas H. ; Mayer, Theresa S.

  • Author_Institution
    Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA
  • fYear
    2008
  • fDate
    5-11 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this work, the low-loss negative index metamaterial (NIM) design methodology that uses two cascaded frequency selective surface (FCC) screens are extended to design multilayer FSS metamaterial that can be fabricated without the need for alignment between fabrication layers. A metamaterial structure using five cascaded FSS screens was proposed and optimized by a genetic algorithm (GA) to have an index of refraction of -1 with low absorption and mismatch losses in the mid-IR. Measured dielectric and metallic properties incorporated into the model provide confidence that the periodic finite element boundary integral (PFEBI) predictions are accurate. Extension of the design to six screens indicates that the effective properties are approaching those of a bulk material. Efforts are currently underway to fabricate and test a multilayer FSS NIM.
  • Keywords
    boundary integral equations; finite element analysis; genetic algorithms; metamaterials; optical design techniques; optical losses; optical multilayers; refractive index; PFEBI; absorption loss; cascaded frequency selective surface screens; dielectric property; generic algorithm; infrared material; low-loss negative index metamaterial; metallic property; midIR material; mismatch loss; multilayer FSS metamaterial structure; periodic finite element boundary integral method; refraction index; Absorption; Design methodology; Dielectric measurements; FCC; Fabrication; Frequency selective surfaces; Genetic algorithms; Metamaterials; Nonhomogeneous media; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2008. AP-S 2008. IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2041-4
  • Electronic_ISBN
    978-1-4244-2042-1
  • Type

    conf

  • DOI
    10.1109/APS.2008.4619594
  • Filename
    4619594