DocumentCode
277205
Title
Development of a CMOS switched-capacitor instrumentation amplifier
Author
Toffolo, G. ; Yick, P. ; White, N.M.
Author_Institution
Ecole Nat. Superieure des Telecommun., Paris, France
fYear
1992
fDate
33704
Firstpage
42401
Abstract
Summary form only given. Outlines the design and simulation of an instrumentation amplifier analogue cell for incorporation into an ASIC sub-system for smart sensors. The ASIC will be fabricated using ES2´s 1 μm CMOS n-well process. The existing analogue library for this process does not contain high specification devices which can be used as low-frequency programmable gain instrumentation amplifiers. Target requirements for the device include a low offset voltage drift, digital controllable gain selection, high CMRR and good power supply rejection. CMOS capacitors tend to show improved tolerances (±0.1%) and low temperature coefficients (10-50ppm/°C). For these reasons a switched capacitor circuit configuration has been adopted. MOS transistors also possess the advantage of exhibiting near-zero voltage offset when configured as an analogue switch
Keywords
CMOS integrated circuits; application specific integrated circuits; cellular arrays; instrumentation amplifiers; switched capacitor networks; 1 micron; ASIC sub-system; CMOS amplifiers; CMOS capacitors; CMOS n-well process; CMRR; LF amplifiers; analogue switch; digital controllable gain selection; instrumentation amplifier analogue cell; offset voltage drift; power supply rejection; programmable gain instrumentation amplifiers; smart sensors; switched capacitor circuit; switched-capacitor instrumentation amplifier; temperature coefficients; tolerances;
fLanguage
English
Publisher
iet
Conference_Titel
ASICs for Measurement Systems, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
168167
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