DocumentCode :
277205
Title :
Development of a CMOS switched-capacitor instrumentation amplifier
Author :
Toffolo, G. ; Yick, P. ; White, N.M.
Author_Institution :
Ecole Nat. Superieure des Telecommun., Paris, France
fYear :
1992
fDate :
33704
Firstpage :
42401
Abstract :
Summary form only given. Outlines the design and simulation of an instrumentation amplifier analogue cell for incorporation into an ASIC sub-system for smart sensors. The ASIC will be fabricated using ES2´s 1 μm CMOS n-well process. The existing analogue library for this process does not contain high specification devices which can be used as low-frequency programmable gain instrumentation amplifiers. Target requirements for the device include a low offset voltage drift, digital controllable gain selection, high CMRR and good power supply rejection. CMOS capacitors tend to show improved tolerances (±0.1%) and low temperature coefficients (10-50ppm/°C). For these reasons a switched capacitor circuit configuration has been adopted. MOS transistors also possess the advantage of exhibiting near-zero voltage offset when configured as an analogue switch
Keywords :
CMOS integrated circuits; application specific integrated circuits; cellular arrays; instrumentation amplifiers; switched capacitor networks; 1 micron; ASIC sub-system; CMOS amplifiers; CMOS capacitors; CMOS n-well process; CMRR; LF amplifiers; analogue switch; digital controllable gain selection; instrumentation amplifier analogue cell; offset voltage drift; power supply rejection; programmable gain instrumentation amplifiers; smart sensors; switched capacitor circuit; switched-capacitor instrumentation amplifier; temperature coefficients; tolerances;
fLanguage :
English
Publisher :
iet
Conference_Titel :
ASICs for Measurement Systems, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
168167
Link To Document :
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