DocumentCode :
2772314
Title :
Feasibility study of a non-destructive fruit maturity testing system on banana utilising capacitive properties
Author :
Zulhusin ; Aziz, A. Hallis A ; Ahmad, R.B.
Author_Institution :
Sch. of Comput. & Commun. Eng., Univ. Malaysia Perlis, Arau
fYear :
2008
fDate :
1-3 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
Fruit maturity classification is hard to determine. This is certainly true, for some fruits whose color have no direct correlation with its level of maturity or ripeness. The levels of maturity can be determined by human expert, however for larger quantity inspection, this method is beyond practical. Therefore, accurate automatic classification for fruit maturity may be advantageous for the agriculture industry. In addition, consumers in supermarkets may also benefit from this system. This paper describes variant methods used for this purpose and the method which is proposed to enhance the measuring techniques. Feasibility study been conducted for nondestructive fruit maturity classifier system based on capacitive properties measurement methods using parallelplate capacitor. This method is used to determine different levels of fruit maturity using dielectrics of banana hence it is suitable for this measuring technique because it does not destroy the texture and the nutrient of fruit.
Keywords :
agricultural products; capacitance measurement; capacitors; inspection; nondestructive testing; voltage measurement; agriculture industry; capacitance measurement; nondestructive fruit maturity testing system; parallelplate capacitor; quantity inspection; voltage measurement; Capacitors; Chemical analysis; Dielectric constant; Dielectric materials; Dielectric measurements; Force measurement; Nondestructive testing; Nuclear magnetic resonance; Solids; System testing; Capacitive and Maturity; Dielectric;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, 2008. ICED 2008. International Conference on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-2315-6
Electronic_ISBN :
978-1-4244-2315-6
Type :
conf
DOI :
10.1109/ICED.2008.4786768
Filename :
4786768
Link To Document :
بازگشت