• DocumentCode
    2772374
  • Title

    Origin of near-band-edge photoluminescence of GaAsN

  • Author

    Inagaki, M. ; Suzuki, H. ; Kojima, N. ; Ohshita, Y. ; Yamaguchi, M.

  • Author_Institution
    Toyota Technol. Inst., Nagoya, Japan
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    The emission processes at high energy edge of PL spectra of GaAsN are clarified by the temperature dependence photoluminescence (PL) spectra and time resolved PL spectra. The PL spectra and TR-PL spectra of GaAsN are deconvoluted by three Gaussian functions (P1, P2 and P3 from high energy side). There are three emission processes at high energy edge of PL spectra of GaAsN. The energies of P2 and P3 are ~6 meV and ~17 meV lower than that of P1. The integrated intensity of P1 increases with increasing temperature from 4.2K to 50K, while those of the other peaks decrease. From these results, following possibility are suggested: (i) the origin of P1 is band to band transition, (ii) the origin of P2 is caused by free exciton or shallow donor related recombination, and (iii) P3 originate from donor-acceptor pair emission or overlapping of emission which comes from a number of localized states.
  • Keywords
    III-V semiconductors; arsenic compounds; gallium compounds; nitrogen compounds; photoluminescence; GaAsN; Gaussian function; donor acceptor pair emission; emission process; near band edge photoluminescence; shallow donor related recombination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616417
  • Filename
    5616417