Dynamics analysis of the AFM manipulator-sample interaction using nano-contact mechanics models

Various nano-contact mechanics models have been proposed for modeling of the AFM (atomic force microscopy) cantilever tip and its interaction with the sample, adhesion analysis, contact forces, and indentation depth in sample-surface. In this paper, the role of applied load and adhesion force work in the process of contact for cantilever tip indentation are analysed and their effects on tip-sample contact radius in COS-PT (Carpick-Ogletree-Salmeron, Pietrement-Troyon) empirical model and BCP (Burnham-Colton-Pollock) semiempirical model with theoretical models such as Hertz, DMT (Derjaguin-Muller-Toporov), JKRS (Johnson-Kendall-Roberts-Sperling) and MD (Maugis-Dugdale) models are compared. According to dynamics modeling of the AFM cantilever tip and its interaction with the sample by nano-contact mechanics models, the variation of applied load and tip-sample contact radius by applying cantilever base position displacement is discussed. In addition, cantilever dynamics behaviour and penetration depth in sample-surface are illustrated, and the influence of the AFM tip geometry is investigated.