• DocumentCode
    2772989
  • Title

    Bidirectional Influence of Defects and Functional Size

  • Author

    Trudel, Sylvie ; Abran, Alain

  • Author_Institution
    Pyxis Technol., Quebec City, QC, Canada
  • fYear
    2011
  • fDate
    3-4 Nov. 2011
  • Firstpage
    69
  • Lastpage
    75
  • Abstract
    This paper reports on a research project investigating the contribution of functional size measurers to finding defects in requirements. In previous experiments, the concurrent inspection of the same requirements document by a measurer in addition to inspectors showed that the functional size measurement activity adds value in finding functional defects that inspectors have not identified. This paper presents an analysis of the influence of defects on the functional size once many of the identified defects have been fixed. For these experiments, the measurers used COSMIC - ISO 19761 to measure functional size and to find defects. Experiments findings show an increase in functional size and a decrease in defects identified.
  • Keywords
    software metrics; COSMIC-ISO 19761; defect bidirectional influence; functional size measurement activity; functional size measurers; Atmospheric measurements; Inspection; Particle measurements; Size measurement; Software; Software measurement; Time measurement; COSMIC – ISO 19761; FSM; Functional size; defects; measure; quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Measurement, 2011 Joint Conference of the 21st Int'l Workshop on and 6th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA)
  • Conference_Location
    Nara
  • Print_ISBN
    978-1-4577-1930-1
  • Type

    conf

  • DOI
    10.1109/IWSM-MENSURA.2011.21
  • Filename
    6113046