DocumentCode
2772989
Title
Bidirectional Influence of Defects and Functional Size
Author
Trudel, Sylvie ; Abran, Alain
Author_Institution
Pyxis Technol., Quebec City, QC, Canada
fYear
2011
fDate
3-4 Nov. 2011
Firstpage
69
Lastpage
75
Abstract
This paper reports on a research project investigating the contribution of functional size measurers to finding defects in requirements. In previous experiments, the concurrent inspection of the same requirements document by a measurer in addition to inspectors showed that the functional size measurement activity adds value in finding functional defects that inspectors have not identified. This paper presents an analysis of the influence of defects on the functional size once many of the identified defects have been fixed. For these experiments, the measurers used COSMIC - ISO 19761 to measure functional size and to find defects. Experiments findings show an increase in functional size and a decrease in defects identified.
Keywords
software metrics; COSMIC-ISO 19761; defect bidirectional influence; functional size measurement activity; functional size measurers; Atmospheric measurements; Inspection; Particle measurements; Size measurement; Software; Software measurement; Time measurement; COSMIC ISO 19761; FSM; Functional size; defects; measure; quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Measurement, 2011 Joint Conference of the 21st Int'l Workshop on and 6th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA)
Conference_Location
Nara
Print_ISBN
978-1-4577-1930-1
Type
conf
DOI
10.1109/IWSM-MENSURA.2011.21
Filename
6113046
Link To Document