• DocumentCode
    2773163
  • Title

    Mismatch improvement for high image rejection in two path switched-capacitor sigma-delta modulators

  • Author

    Cheng, W.T. ; Pun, K.P. ; Choy, C.S. ; Chan, C.F.

  • Author_Institution
    Dept. of Electron. Eng., Chinese Univ. of Hong Kong, China
  • fYear
    2003
  • fDate
    16-18 Dec. 2003
  • Firstpage
    441
  • Lastpage
    444
  • Abstract
    In IF-sampling A/D converters employing lowpass sigma-delta modulators, the mismatches between the in-phase (I) and quadrature-phase (Q) channels, including the mismatch between the I and Q sampling capacitors, will limit their image rejection performance. In this paper, a technique of sharing front-end sampling capacitor pairs between I and Q channels is proposed to eliminate their mismatch and thus to improve the image rejection performance of the IF-sampling ADC. Behavioral simulation results are presented to demonstrate the technique.
  • Keywords
    circuit simulation; integrated circuits; modulators; sigma-delta modulation; switched capacitor networks; A/D converters; Q channels; image rejection; modulators; quadrature-phase channels; sampling capacitor; simulation; switched-capacitor; Baseband; Capacitors; Circuits; Computed tomography; Delta-sigma modulation; Energy consumption; Frequency conversion; Image converters; Image sampling; Receivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
  • Print_ISBN
    0-7803-7749-4
  • Type

    conf

  • DOI
    10.1109/EDSSC.2003.1283568
  • Filename
    1283568