DocumentCode :
2773163
Title :
Mismatch improvement for high image rejection in two path switched-capacitor sigma-delta modulators
Author :
Cheng, W.T. ; Pun, K.P. ; Choy, C.S. ; Chan, C.F.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, China
fYear :
2003
fDate :
16-18 Dec. 2003
Firstpage :
441
Lastpage :
444
Abstract :
In IF-sampling A/D converters employing lowpass sigma-delta modulators, the mismatches between the in-phase (I) and quadrature-phase (Q) channels, including the mismatch between the I and Q sampling capacitors, will limit their image rejection performance. In this paper, a technique of sharing front-end sampling capacitor pairs between I and Q channels is proposed to eliminate their mismatch and thus to improve the image rejection performance of the IF-sampling ADC. Behavioral simulation results are presented to demonstrate the technique.
Keywords :
circuit simulation; integrated circuits; modulators; sigma-delta modulation; switched capacitor networks; A/D converters; Q channels; image rejection; modulators; quadrature-phase channels; sampling capacitor; simulation; switched-capacitor; Baseband; Capacitors; Circuits; Computed tomography; Delta-sigma modulation; Energy consumption; Frequency conversion; Image converters; Image sampling; Receivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
Print_ISBN :
0-7803-7749-4
Type :
conf
DOI :
10.1109/EDSSC.2003.1283568
Filename :
1283568
Link To Document :
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