Title :
High performance radiation hardened register cell design on standard CMOS process
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Wisconsin-Milwaukee, Milwaukee, WI, USA
Abstract :
We propose a new radiation hardened flip flop design suitable for mainstream CMOS processing flow. The simulation results show shorter data to Q delay than sense amplifier type flip flop used in Alpha 21264 microprocessor.
Keywords :
CMOS logic circuits; Q-factor; delay circuits; flip-flops; CMOS integrated circuits; CMOS process; Q delay; flip flop design; radiation hardened register cell design; CMOS process; Clocks; Delay; Digital systems; Error correction codes; Feedback; Flip-flops; Latches; Master-slave; Radiation hardening;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2003 IEEE Conference on
Print_ISBN :
0-7803-7749-4
DOI :
10.1109/EDSSC.2003.1283584
